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M29DW256G70ZA6F TR

M29DW256G70ZA6F TR

  • 厂商:

    MICRON(镁光)

  • 封装:

    TBGA-64

  • 描述:

    IC FLASH 256MBIT PARALLEL 64TBGA

  • 数据手册
  • 价格&库存
M29DW256G70ZA6F TR 数据手册
256Mb: 3V Embedded Parallel NOR Flash Features Micron Parallel NOR Flash Embedded Memory M29DW256G X16 Multiple Bank, Page, Dual Boot 3V Supply Flash Memory Features • VPP/WP# pin for fast program and write – Protects the four outermost parameter blocks • Software protection – Volatile protection – Nonvolatile protection – Password protection • Extended memory block – Programmed or locked at the factory or by the customer – 128 word factory locked and 128 word customer lockable • Common flash interface – 64-bit security code • Low power consumption: standby and automatic mode • 100,000 minimum PROGRAM/ERASE cycles per block • Data retention: 20 years (TYP) • Fortified BGA, TBGA, and TSOP packages • Green packages available – RoHS-compliant – Halogen-free • Automotive certified parts available – Automotive device grade: temperature –40°C to +85°C (automotive grade certified) • Root part number – M29DW256G • Device code – 227Eh + 223Ch + 2202h • Supply voltage – VCC = 2.7–3.6V (program, erase, read) – VCCQ = 1.65–3.6V (I/O buffers) – VPPH = 9V for fast program (optional) • Asynchronous random/page read – Page size: 8 words – Page access: 25ns, 30ns – Random access: 70ns, 80ns • Fast program commands: 32-word • Enhanced buffered program commands: 256-word • Program time – 16µs per byte/word TYP – Chip program time: 10 s with V PPH and 16s without V PPH • Memory organization – Quadruple bank memory array: 32Mb + 96Mb + 96Mb + 32Mb with parameter blocks at top and bottom – Dual operation: program/erase in one bank while reading in any other bank • Program/erase controller – Embedded word program algorithms • Program/erase suspend and resume capability – Read from any block during a PROGRAM SUSPEND operation – Read or program another block during an ERASE SUSPEND operation • Unlock bypass, block erase, chip erase, write to buffer, and enhanced buffer program commands – Fast buffered/batch programming – Fast block/chip erase CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 1 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. Products and specifications discussed herein are subject to change by Micron without notice. 256Mb: 3V Embedded Parallel NOR Flash Features Part Numbering Information Available with extended memory block prelocked by Micron. Devices are shipped from the factory with memory content bits erased to 1. For available options, such as packages or high/low protection, or for further information, contact your Micron sales representative. Part numbers can be verified at www.micron.com. Feature and specification comparison by device type is available at www.micron.com/products. Contact the factory for devices not found. Table 1: Part Number Information Part Number Category Category Details Notes Device Type M29 Architecture D = Dual operation Operating Voltage W = VCC = 2.7 to 3.6V Device function 256G = 256Mb (x16) page, dual boot Speed 70 = 70ns 1, 2 7A = 70ns 1, 2 Package NF = 56-pin TSOP, 14mm x 20mm, lead-free, halogen-free, RoHS-compliant ZA = 64-pin TBGA, 10mm x 13mm, lead-free, halogen-free, RoHS-compliant ZS = 64-pin Fortified BGA, 11mm x 13mm, lead-free, halogen-free, RoHS-compliant Temperature Range 1 = 0 to 70°C 6 = –40°C to +85°C Shipping Options E = RoHS-compliant package, standard packing F = RoHS-compliant package, tape and reel packing Notes: 1. 80ns if VCCQ = 1.65V to VCC. 2. Automotive certified –40°C to +85°C, available only with option 6. CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 2 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Features Contents Important Notes and Warnings ......................................................................................................................... 7 Description ...................................................................................................................................................... 7 Signals ......................................................................................................................................................... 9 Signal Assignments ......................................................................................................................................... 10 Signal Descriptions ......................................................................................................................................... 12 Memory Organization .................................................................................................................................... 14 Memory Configuration ............................................................................................................................... 14 Block Addresses and Protection Groups ....................................................................................................... 15 Bus Operations ............................................................................................................................................... 19 Read .......................................................................................................................................................... 19 Write .......................................................................................................................................................... 19 Standby and Automatic Standby ................................................................................................................. 19 Output Disable ........................................................................................................................................... 20 Reset .......................................................................................................................................................... 20 Registers ........................................................................................................................................................ 21 Status Register ............................................................................................................................................ 21 Lock Register .............................................................................................................................................. 26 Standard Command Definitions – Address-Data Cycles .................................................................................... 28 READ and AUTO SELECT Operations .............................................................................................................. 31 READ/RESET Command ............................................................................................................................ 31 READ CFI Command .................................................................................................................................. 31 UNLOCK BYPASS READ CFI Command ....................................................................................................... 31 AUTO SELECT Command ........................................................................................................................... 31 Bypass Operations .......................................................................................................................................... 33 UNLOCK BYPASS Command ...................................................................................................................... 33 UNLOCK BYPASS RESET Command ............................................................................................................ 33 Program Operations ....................................................................................................................................... 34 PROGRAM Command ................................................................................................................................ 34 UNLOCK BYPASS PROGRAM Command ..................................................................................................... 34 WRITE TO BUFFER PROGRAM Command .................................................................................................. 34 UNLOCK BYPASS WRITE TO BUFFER PROGRAM Command ....................................................................... 37 WRITE TO BUFFER PROGRAM CONFIRM Command .................................................................................. 37 BUFFERED PROGRAM ABORT AND RESET Command ................................................................................ 37 PROGRAM SUSPEND Command ................................................................................................................ 37 PROGRAM RESUME Command .................................................................................................................. 38 WRITE TO BUFFER PROGRAM SUSPEND Command .................................................................................. 38 WRITE TO BUFFER PROGRAM RESUME Command .................................................................................... 39 ENTER ENHANCED BUFFERED Command ................................................................................................ 39 ENHANCED BUFFERED PROGRAM Command ........................................................................................... 39 ENHANCED BUFFERED PROGRAM ABORT RESET Command .................................................................... 40 EXIT ENHANCED BUFFERED PROGRAM Command ................................................................................... 42 Erase Operations ............................................................................................................................................ 43 CHIP ERASE Command .............................................................................................................................. 43 UNLOCK BYPASS CHIP ERASE Command ................................................................................................... 43 BLOCK ERASE Command ........................................................................................................................... 43 UNLOCK BYPASS BLOCK ERASE Command ................................................................................................ 44 ERASE SUSPEND Command ....................................................................................................................... 44 ERASE RESUME Command ........................................................................................................................ 45 Block Protection Command Definitions – Address-Data Cycles ........................................................................ 46 Protection Operations .................................................................................................................................... 48 CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 3 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Features LOCK REGISTER Commands ...................................................................................................................... PASSWORD PROTECTION Commands ....................................................................................................... NONVOLATILE PROTECTION Commands .................................................................................................. NONVOLATILE PROTECTION BIT LOCK BIT Commands ............................................................................ VOLATILE PROTECTION Commands .......................................................................................................... EXTENDED MEMORY BLOCK Commands .................................................................................................. EXIT PROTECTION Command .................................................................................................................... Device Protection ........................................................................................................................................... Hardware Protection .................................................................................................................................. Software Protection .................................................................................................................................... Volatile Protection Mode ............................................................................................................................. Nonvolatile Protection Mode ...................................................................................................................... Password Protection Mode .......................................................................................................................... Dual Operations and Multiple Bank Architecture ............................................................................................. Common Flash Interface ................................................................................................................................ Power-Up and Reset Characteristics ................................................................................................................ Absolute Ratings and Operating Conditions ..................................................................................................... DC Characteristics .......................................................................................................................................... Read AC Characteristics .................................................................................................................................. Write AC Characteristics ................................................................................................................................. Accelerated Program, Data Polling/Toggle AC Characteristics ........................................................................... Program/Erase Characteristics ........................................................................................................................ Package Dimensions ....................................................................................................................................... Revision History ............................................................................................................................................. Rev. B – 5/18 ............................................................................................................................................... Rev. A – 10/12 ............................................................................................................................................. CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 4 48 48 49 50 51 51 52 53 53 53 54 54 55 57 59 62 64 66 67 69 73 75 76 79 79 79 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Features List of Figures Figure 1: Logic diagram ................................................................................................................................... 9 Figure 2: 56-Pin TSOP (Top View) .................................................................................................................. 10 Figure 3: 64-Pin Fortified BGA and 64-Pin TBGA ............................................................................................. 11 Figure 4: Block Addresses .............................................................................................................................. 14 Figure 5: Data Polling Flowchart .................................................................................................................... 23 Figure 6: Toggle Bit Flowchart ........................................................................................................................ 24 Figure 7: Status Register Polling Flowchart ..................................................................................................... 25 Figure 8: Lock Register Program Flowchart ..................................................................................................... 27 Figure 9: WRITE TO BUFFER PROGRAM Flowchart ........................................................................................ 36 Figure 10: ENHANCED BUFFERED PROGRAM Flowchart ............................................................................... 41 Figure 11: Program/Erase Nonvolatile Protection Bit Algorithm ...................................................................... 50 Figure 12: Software Protection Scheme .......................................................................................................... 56 Figure 13: Power-Up Timing .......................................................................................................................... 62 Figure 14: Reset AC Timing – No PROGRAM/ERASE Operation in Progress ...................................................... 63 Figure 15: Reset AC Timing During PROGRAM/ERASE Operation .................................................................... 63 Figure 16: AC Measurement Load Circuit ....................................................................................................... 65 Figure 17: AC Measurement I/O Waveform ..................................................................................................... 65 Figure 18: Random Read AC Timing ............................................................................................................... 67 Figure 19: Page Read AC Timing ..................................................................................................................... 68 Figure 20: WE#-Controlled Program AC Timing .............................................................................................. 70 Figure 21: CE#-Controlled Program AC Timing ............................................................................................... 72 Figure 22: Accelerated Program AC Timing ..................................................................................................... 73 Figure 23: Data Polling AC Timing .................................................................................................................. 74 Figure 24: Toggle/Alternative Toggle Bit Polling AC Timing .............................................................................. 74 Figure 25: 56-Pin TSOP – 14mm x 20mm ........................................................................................................ 76 Figure 26: 64-Pin TBGA – 10mm x 13mm ........................................................................................................ 77 Figure 27: 64-Ball Fortified BGA – 11mm x 13mm ........................................................................................... 78 CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 5 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Features List of Tables Table 1: Part Number Information ................................................................................................................... 2 Table 2: Signal names ...................................................................................................................................... 9 Table 3: Signal Descriptions ........................................................................................................................... 12 Table 4: Bank architecture ............................................................................................................................. 14 Table 5: Bank A ............................................................................................................................................. 15 Table 6: Bank B ............................................................................................................................................. 15 Table 7: Bank C ............................................................................................................................................. 17 Table 8: Bank D ............................................................................................................................................. 18 Table 9: Bus Operations ................................................................................................................................. 19 Table 10: Status Register Bit Definitions ......................................................................................................... 21 Table 11: Operations and Corresponding Bit Settings ...................................................................................... 22 Table 12: Lock Register Bit Definitions ............................................................................................................ 26 Table 13: Block Protection Status ................................................................................................................... 26 Table 14: Standard Command Definitions – Address-Data Cycles, 16-Bit ......................................................... 28 Table 15: Read Electronic Signature, Auto Select Mode and Programmer Method ............................................. 32 Table 16: Block protection (16-bit mode) ........................................................................................................ 32 Table 17: Block Protection Command Definitions – Address-Data Cycles, 16-Bit .............................................. 46 Table 18: Extended Memory Block Address and Data ...................................................................................... 51 Table 19: V PP/WP# Functions ......................................................................................................................... 53 Table 20: Dual Operations Allowed in Other Banks ......................................................................................... 57 Table 21: Dual Operations Allowed in Same Bank ........................................................................................... 58 Table 22: Query Structure Overview ............................................................................................................... 59 Table 23: CFI Query Identification String ........................................................................................................ 59 Table 24: CFI Query System Interface Information .......................................................................................... 60 Table 25: Device Geometry Definition ............................................................................................................ 60 Table 26: Primary Algorithm-Specific Extended Query Table ........................................................................... 61 Table 27: Security Code Area .......................................................................................................................... 61 Table 28: Power-Up Wait Timing Specifications .............................................................................................. 62 Table 29: Reset AC Specifications ................................................................................................................... 63 Table 30: Absolute Maximum/Minimum Ratings ............................................................................................ 64 Table 31: Operating Conditions ...................................................................................................................... 64 Table 32: Input/Output Capacitance1 ............................................................................................................. 65 Table 33: DC Current Characteristics .............................................................................................................. 66 Table 34: DC Voltage Characteristics .............................................................................................................. 66 Table 35: Read AC Characteristics .................................................................................................................. 67 Table 36: WE#-Controlled Write AC Characteristics ......................................................................................... 69 Table 37: CE#-Controlled Write AC Characteristics ......................................................................................... 71 Table 38: Accelerated Program and Data Polling/Data Toggle AC Characteristics .............................................. 73 Table 39: Program/Erase Characteristics ........................................................................................................ 75 CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 6 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Important Notes and Warnings Important Notes and Warnings Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions. This document supersedes and replaces all information supplied prior to the publication hereof. You may not rely on any information set forth in this document if you obtain the product described herein from any unauthorized distributor or other source not authorized by Micron. Automotive Applications. Products are not designed or intended for use in automotive applications unless specifically designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distributor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage resulting directly or indirectly from any use of nonautomotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and conditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron products are not designed or intended for use in automotive applications unless specifically designated by Micron as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to indemnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage resulting from any use of non-automotive-grade products in automotive applications. Critical Applications. Products are not authorized for use in applications in which failure of the Micron component could result, directly or indirectly in death, personal injury, or severe property or environmental damage ("Critical Applications"). Customer must protect against death, personal injury, and severe property and environmental damage by incorporating safety design measures into customer's applications to ensure that failure of the Micron component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron component for any critical application, customer and distributor shall indemnify and hold harmless Micron and its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, or death arising in any way out of such critical application, whether or not Micron or its subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the Micron product. Customer Responsibility. Customers are responsible for the design, manufacture, and operation of their systems, applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT FAILURE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included in customer's applications and products to eliminate the risk that personal injury, death, or severe property or environmental damages will result from failure of any semiconductor component. Limited Warranty. In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort, warranty, breach of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly authorized representative. Description The M29DW256G is a 256Mb (16Mb x16) non-volatile memory that can be read, erased and reprogrammed. These operations can be performed using a single low voltage (2.7 to 3.6 V) supply. At power-up the memory defaults to its read mode. CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 7 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Description The M29DW256G features an asymmetrical block architecture, with 8 parameter and 126 main blocks, divided into four banks, A, B, C and D, providing multiple bank operations. While programming or erasing in one bank, read operations are possible in any other bank. Four of the parameter blocks are at the top of the memory address space, and four are at the bottom. Program and erase commands are written to the command interface of the memory. An on-chip program/erase controller simplifies the process of programming or erasing the memory by taking care of all of the special operations that are required to update the memory contents. The end of a program or erase operation can be detected and any error conditions identified. The command set required to control the memory is consistent with JEDEC standards. Chip Enable, Output Enable and Write Enable signals control the bus operations of the memory. They allow simple connection to most microprocessors, often without additional logic. The device supports asynchronous random read and page read from all blocks of the memory array. The device also features a write to buffer program capability that improves the programming throughput by programming 32 words in one instance. The enhanced buffered program feature is also available to speed up programming throughput, allowing 256 words to be programmed at once. The V PP/WP# signal can be used to enable faster programming of the device. The M29DW256G has one extra 256-word extended block that can be accessed using a dedicated command: 128-Word factory locked and 128-Word customer lockable. The extended block can be protected and so is useful for storing security information. However the protection is irreversible; once protected the protection cannot be undone. The device features different levels of hardware and software block protection to avoid unwanted program or erase (modify): • Hardware protection: V PP/WP# provides hardware protection on four outermost parameter blocks (two at the top and two at the bottom of the address space) • Software protection: Volatile protection, nonvolatile protection, password protection The memory is offered in TSOP56 (14mm x 20mm), TBGA64 (10mm x 13mm, 1mm pitch), and FBGA (11mm x 13mm) packages. The memory is delivered with all the bits erased (set to ‘1’). CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 8 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Description Signals Table 2: Signal names Name Description Direction A[23:0] Address inputs Inputs DQ[15:0] Data inputs/outputs I/O CE# Chip enable Input OE# Output enable Input WE# Write enable Input RST# Reset Input RY/BY# Ready/busy output Output VCCQ Input/output buffer supply voltage Supply VCC Supply voltage Supply VPP/WP# VPP/write protect Supply/Input VSS Ground – NC Not connected – Note: 1. 1 VPP/WP# may be left floating as it is internally connected to a pull-up resistor which enables program/erase operations. Figure 1: Logic diagram VCC VCCQ A[23:0] VPP/WP# DQ[15:0] WE# CE# OE# RY/BY# RST# NC VSS CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 9 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Signal Assignments Signal Assignments Figure 2: 56-Pin TSOP (Top View) A23 A22 A15 A14 A13 A12 A11 A10 A9 A8 A19 A20 WE# RST# A21 VPP/WP# RY/BY# A18 A17 A7 A6 A5 A4 A3 A2 A1 RFU RFU Note: CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 RFU RFU A16 RFU VSS DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# VSS CE# A0 RFU VCCQ 1. A[23] = A[MAX]. 10 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Signal Assignments Figure 3: 64-Pin Fortified BGA and 64-Pin TBGA 1 3 2 4 5 7 6 8 8 7 6 5 4 3 2 1 A A RFU A3 A7 RY/BY# WE# A9 A13 RFU RFU A13 A9 WE# RY/BY# A7 A3 RFU B B RFU A4 A17 VPP/WP# RST# A8 A12 A22 A22 A12 A8 RST# VPP/WP# A17 A4 RFU C C RFU A2 A6 A18 A21 A10 A14 A23 A23 A14 A10 A21 A18 A6 A2 RFU D D RFU A1 A5 A20 A19 A11 A15 VCCQ VCCQ A15 A11 A19 A20 A5 A1 RFU E E A0 D0 D2 D5 D7 A16 VSS VSS VCCQ CE# D8 D10 D12 D14 RFU RFU RFU RFU D14 D12 D10 D8 CE# VCCQ RFU OE# D9 D11 VCC D13 D15 RFU RFU D15 D13 VCC D11 D9 OE# RFU RFU VSS D1 D3 D4 D6 VSS RFU RFU VSS D6 D4 D3 D1 VSS RFU RFU A16 D7 D5 D2 D0 A0 RFU F F G G H H Top view – ball side down Note: CCMTD-1725822587-2414 m29dw_256g.pdf - Rev. B 5/18 EN Bottom view – ball side up 1. A[23] = A[MAX]. 11 Micron Technology, Inc. reserves the right to change products or specifications without notice. © 2012 Micron Technology, Inc. All rights reserved. 256Mb: 3V Embedded Parallel NOR Flash Signal Descriptions Signal Descriptions The signal description table below is a comprehensive list of signals for this device family. All signals listed may not be supported on this device. See Signal Assignments for information specific to this device. Table 3: Signal Descriptions Name Type Description A[MAX:0] Input Address: Selects the cells in the array to access during READ operations. During WRITE operations, they control the commands sent to the command interface of the program/erase controller. DQ[15:0] I/O Data I/O: Outputs the data stored at the selected address during a READ operation. During WRITE operations, they represent the commands sent to the command interface of the internal state machine. During WRITE operations, bits DQ[15:8] are not used. When reading the status register, these bits should be ignored. CE# Input Chip enable: Activates the device, enabling READ and WRITE operations to be performed. When CE# is HIGH, the device goes to standby and data outputs are at HIGH-Z. OE# Input Output enable: Controls the bus READ operation. WE# Input Write enable: Controls the bus WRITE operation of the command interface. VPP/WP# Input VPP/Write Protect: Provides two functions. The VPPH function enables the device to bypass unlock cycles and use an external high voltage power supply to reduce time required for PROGRAM operations. Second, When VPP/WP# is LOW, the four outermost blocks of the address space (two 32KW blocks at the top and two 32KW blocks at the bottom) are protected; PROGRAM and ERASE operations are ignored and the blocks remain protected regardless of the block protection status or the RST# pin state. When VPP/WP# is HIGH, the memory reverts to the previous protection status for those blocks (Refer to Hardware Protection and Bypass Operations for details). RST# Input Reset: Applies a hardware reset to the device, which is achieved by holding RST# LOW for at least tPLPX. After RST# goes HIGH, the device is ready for READ and WRITE operations (after tPHEL or tRHEL, whichever occurs last). See RESET AC Specifications for more details. RY/BY# Output Ready busy: Open-drain output that can be used to identify when the device is performing a PROGRAM or ERASE operation. During PROGRAM or ERASE operations, RY/BY# is LOW, and is High-Z during read mode, auto select mode, and erase suspend mode. After a hardware reset, READ and WRITE operations cannot begin until RY/BY# goes High-Z (see RESET AC Specifications for more details). The use of an open-drain output enables the RY/BY# pins from several devices to be connected to a single pull-up resistor to VCCQ. A low value will then indicate that one or more of the devices is busy. VCC Supply Supply voltage: Provides the power supply for READ, PROGRAM, and ERASE operations. The command interface is disabled when VCC
M29DW256G70ZA6F TR 价格&库存

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